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Spectral quantum efficiency

Spectral quantum efficiency & reflectance

  • 商品编号:Spectral quantum efficiency
  • 货  号:Spectral quantum efficiency
  • 品  牌:pv-tools
  • 销售价:
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IQE-SCAN

Spectral quantum efficiency
& reflectance

This tool is designed for the automated IQE analysis of
crystalline silicon solar cells. Some features are:

  • The solar cells are illuminated with variable light, either homogeneously over an area of 20 x 20 mm,
    or with a focussed spot of approx. 1 x 3 mm².
  • Full area EQE & reflectance measurements by moving the 4 cm² illuminated area continuously.
  • Monochromatic light between 280-1600 nm from monochromator (2 gratings, slit width and order filter changed automatically). Typically used bandwidth is 8 nm FWHM and the wavelength accuracy is 1 nm.
  • White bias light up to 1.2 suns is restricted to the area of monochromatic illumination.
  • Bias-ramp for automatic determination of the correct bias light intensity for quasi-absolute EQE measurements
    in only one wavelength scan. The procedure is also useful to check the linearity of the solar cell.
  • The reflectance is measured under an 8° tilted beam of 2 x 2 cm² area with a BaSO4-coated integrating sphere.
  • Batch mode for series of measurements under different conditions.
  • The solar cells are held on a temperature controlled vacuum chuck (25 °C) which can be moved by a motorized
    x-y-z stage. The temperature is measured directly at the back of the solar cell.
  • Transimpedance amplifier (max. 200 mA) holds solar cell at short circuit with remote sense
    and contact quality check.
  • Automatic calibration of EQE and reflectance
    • –  increases throughput and reduces the necessary time of operator interaction.
    • –  makes the operation safer against human errors (misalignment, bias light, etc).
    • –  avoids degradation of the reference solar cell by manual handling.
  • Motorized contact-setting and change-over between EQE and reflectance measurements.
  • Data analysis by comparison with analytical electrical and optical model.
  • Duration:
    • –  ca. 1 sec. per wavelength for spot measurement (2 x 2 cm²)
    • –  ca. 9 sec. per wavelength for 12.5 x 12.5 cm² solar cell
    • –  ca. 12 sec. per wavelength for 15.6 x 15.6 cm² solar cell
  • EQE and reflectance mapping with focussed light spot (QMAP)
    within 5 min for a 15.6 x 15.6 cm² cell per map and wavelength.
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