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 | 少子寿命测试仪 WCT-120美国Sinton WCT-120少子寿命测试仪器采用了独特的测量和分析技术，包括类似平稳状态photoconductance (QSSPC)测量方法。可灵敏地反映单晶体重金属污染及陷阱效应表面复合效应等缺陷情况。WCT一个高度被看待的研究和过程工具。QSSPC终身测量也产生含蓄的打开电路电压(对照明)曲线，与最后的I-V曲线是可比较的在一个太阳能电池过程的每个阶段。 |
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 | 少子寿命测量仪BLS-I and BCT-400测试硅棒或者硅锭少子寿命测量仪BLS-I and BCT-400 The BLS-I and BCT-400 measurement systems perform lifetime measurement on monocrystalline or multicrystalline silicon (ingots or bricks) without requiring surface passivation. Since lifetime measurements are among the most sens |
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 | suns-Voc测试仪suns-Voc测试仪:利用Suns-Voc进行浆料与烧结技术优化，主要测试IV曲线 |
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 | WCT-IL800Fast inline testing with no compromises. Monitor wafer lifetime, sheet resistance and trapping with the comprehensive accuracy of an offline tool and an optimized industrial software package. Product Overview The calibrated measurements that have |
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 | SBS-150 少子寿命SBS-150 少子寿命 Measuring as-grown blocks provides the best indication of final wafer lifetime.The SBS-150 bulk-silicon lifetime analyzer is especially sensitive to lifetime variations in the growth direction of silicon ingots铸块，锭, giving an accurate previe |
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 | FMT_CCTFMT_CCT |
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| | 少子寿命测量仪BLS-I and BCT-400少子寿命测量仪BLS-I and BCT-400 |
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