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TLM-SCAN+  Contact resistivity and sheet resistance
 
   
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TLM-SCAN+ Contact resistivity and sheet resistance

TLM-SCAN+ Contact resistivity and sheet resistance The contact resistance of the front metallization is an important contribution to the total series resistance of screen-printed solar cells. The transfer length method with a suitable test structure is

  • 商品编号:G5E8D72A4053B1
  • 货  号:G5E8D72A4053B1
  • 品  牌:pv-tools
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TLM-SCAN+  Contact resistivity and sheet resistance

 

TLM-SCAN+
Contact resistivity and more

Contact resistivity and sheet resistance

The contact resistance of the front metallization is an important contribution to the total series resistance of screen-printed solar cells. The transfer length method with a suitable test structure is the best method to separate the contact resistance from other series resistance effects. However, the contact resistance may vary considerably over the solar cell so a method to measure it with spatial resolution on the finished solar cell is necessary. The TLM-SCAN creates mappings of the contact resistivity of a solar cell that is cut into stripes with a laser or a dicing saw.

The mapping on the right demonstrates the resolution and repeatabilty as it shows the same stripe measured 14 times.

Microscope camera

This camera is used to measure the contact finger width automatically. The contour detection is helpful to verify that the margin of the fingers is properly identified. Larger dimensions can be measured using the chuck positioning and a crosshair in the image.
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